WORKSHOP ON FAULT DIAGNOSIS
AND TOLERANCE IN CRYPTOGRAPHY

Palazzo dei Congressi, Florence, ITALY
Wednesday, June 30, 2004

Final Programme and Presentation Slides

Organizers of the workshop

Luca Breveglieri - Politecnico di Milano, Milano, Italy

Israel Koren - University of Massachusetts, Amherst, MA, USA

breveglieri@elet.polimi.it - koren@ecs.umass.edu

Workshop organised in association with

DSN 2004 - The International Conference
on Dependable Systems and Networks

Palazzo dei Congressi, Florence, ITALY
June 28 - July 1, 2004

http://www.dsn.org


Workshop introduction

In recent years applied cryptography has developed considerably, to satisfy the increasing security requirements of various information technology disciplines, e.g., telecommunications, networking, data base systems and mobile applications. In the past, cryptography mainly relied upon a small number of standard crypto-systems (or algorithms), e.g., DES (private key) and RSA (public key). In the last years, however, numerous novel cryptographic systems have been proposed, e.g.: AES (Advanced Encryption Standard) as a replacement of DES; the emerging ECC (Elliptic Curve Cryptosystems) technology for wireless network applications, which aims at possibly replacing the widespread RSA; and many others.

Crypto-systems are inherently computationally complex, and in order to satisfy the high throughput requirements of many applications, they are often implemented by means of either VLSI devices (crypto-accelerators) or highly optimised software routines (crypto-libraries) and are used via suitable (network) protocols.

The high complexity of such implementations raises concerns regarding their reliability. Research is therefore needed to develop methodologies and techniques for designing robust cryptographic systems (both hardware and software), and to protect them against both accidental faults and intentional intrusions and attacks, in particular those based on the malicious injection of faults into the device for the purpose of extracting the secret key.

Workshop themes

Contributions to the workshop describing theoretical studies and practical case studies of fault diagnosis and tolerance in cryptographic systems (HW and SW) and protocols are solicited. Topics of interest include, but are not limited to:

      Modelling the reliability of cryptographic systems and protocols.

      Inherently reliable cryptographic systems and algorithms.

      Faults and fault models for cryptographic devices (HW and SW).

      Reliability-based attack procedures on cryptographic systems (fault-injection based attacks) and protocols.

      Adapting classical fault diagnosis and tolerance techniques to cryptographic systems.

      Novel fault diagnosis and tolerance techniques for cryptographic systems.

      Case studies of attacks, reliability and fault diagnosis and tolerance techniques in cryptographic systems.

The goals of the workshop are:

      Present the currently available preliminary results and challenges.

      Encourage collaboration among the current researchers and possibly enlarge the community of researchers in this field.

      Advertise the research topic to both the cryptography and fault tolerance research communities, and stimulate the start of new research activities.

Both academic and industrial applicants are invited to submit manuscripts to the workshop.

Summaries or short versions of the accepted contributions will be published in the Supplemental Volume of DSN.

Negotiations are underway for a special issue of a journal devoted to the topic of Fault Diagnosis and Tolerance in Cryptography.


Organizational details

Workshop Dates:

      Submission deadline: March 5th, 2004

      Notification deadline: April 2nd, 2004

      Final paper deadline: April 30th, 2004

      Workshop: Wednesday, June 30th, 2004, Palazzo dei Congressi, Florence, ITALY

      Submissions: extended abstract of 5 to 10 pages, PDF format is preferred.
E-mail the ext. abs. to prof. Luca Breveglieri, mailto:
breveglieri@elet.polimi.it
Please provide name, affiliation, telephone and fax number, and email address.

      Site: www.elet.polimi.it/res/DSN04workshop

      PDF copy of this announcement

Program committee:

      Luca Breveglieri, Politecnico di Milano, Milano, Italy

      Joan Daemen, STMicroelectronics - Proton Technology Division, Zaventem, Belgium

      etin Kaya Ko, Oregon State University, Corvallis, Oregon, USA

      Israel Koren, University of Massachusetts, Amherst, Massachusetts, USA

      Rgis Leveugle, TIMA Laboratory, Grenoble, France

      David Naccache, Gemplus Card International, Issy-les-Moulineaux, France

      Ramesh Karri, Polytechnic University, Brooklyn, New York, USA

      Christof Paar, University of Ruhr, Bochum, Germany

Direct contacts:

Prof. Luca Breveglieri

Dept. of Electronic and Information Sciences

Politecnico di Milano

Piazza Leonardo Da Vinci n. 32

I-20133, Milano

ITALY

Tel: + 39 (0)2 2399 3653 office / 3401 switchboard

Fax: + 39 (0)2 2399 3411

E-mail: breveglieri@elet.polimi.it

Prof. Israel Koren

Department of Electrical and Computer Engineering

University of Massachusetts

Amherst, MA 01003

USA

Tel: + 01 (413) 545-2643

Fax: + 01 (413) 545-1993

E-mail: koren@ecs.umass.edu